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Volumn 109, Issue 9, 2011, Pages

Magnetic properties of ion implanted Ge1-xMnx thin films solidified through pulsed laser melting

(9) Dolph, Melissa Commisso a Kim, Taeseok b Yin, Wenjing a Recht, Daniel b Fan, Wenbin a Yu, Jiani a Aziz, Michael J b Lu, Jiwei a Wolf, Stuart A a

a University of Virginia (United States)

b HARVARD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINITIES; GERMANIUM-ON-INSULATOR WAFERS; IMPLANTATION DAMAGE; ION IMPLANTED; LASER MELTING; MN CONCENTRATIONS;

EXCIMER LASERS; GERMANIUM; ION IMPLANTATION; MAGNETIC PROPERTIES; MANGANESE; MELTING; RAPID THERMAL ANNEALING; SATURATION MAGNETIZATION; THIN FILMS;

PULSED LASERS;

EID: 79959518573 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3590137 Document Type: Article

Times cited : (9)

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