Effects of a silicon probe on gold nanoparticles on glass under evanescent illumination

Optics Express

Volumn 19, Issue 13, 2011, Pages 12679-12687

  Huda, Gazi M ^a,b   Donev, Eugenii U ^a,b   Mengüç, M Pinar ^a,b   Hastings, J Todd ^a,b  

^a UNIVERSITY OF KENTUCKY   (United States)

^b UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ELECTRIC FIELDS; FINITE ELEMENT METHOD; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; SURFACE PLASMON RESONANCE;

EVANESCENT ILLUMINATION; EXCITATION FIELD; GOLD NANOPARTICLES; ILLUMINATION CONDITIONS; INCIDENT LIGHT; LENGTH SCALE; NANO SCALE; NANOPARTICLE IMPACTS; NANOSCALE TIP; PEAK ELECTRIC FIELD; SCATTERED FIELD; SILICON PROBE; SILICON TIPS; SURFACE PLASMONS;

NANOPARTICLES;

GLASS; GOLD; METAL NANOPARTICLE; SILICON;

ARTICLE; CHEMISTRY; FINITE ELEMENT ANALYSIS; ILLUMINATION; METHODOLOGY; NANOTECHNOLOGY; RADIATION; RADIATION SCATTERING; SURFACE PLASMON RESONANCE;

FINITE ELEMENT ANALYSIS; GLASS; GOLD; LIGHTING; METAL NANOPARTICLES; NANOTECHNOLOGY; RADIATION; SCATTERING, RADIATION; SILICON; SURFACE PLASMON RESONANCE;

EID: 79959453566     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.012679     Document Type: Article

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