Magnetoelectric effect and critical thickness for ferroelectricity in Co/BaTiO3/Co multiferroic tunnel junctions

Journal of Applied Physics

Volumn 109, Issue 11, 2011, Pages

  Cao, Dan ^a   Cai, Meng Qiu ^a,b,c   Hu, Wang Yu ^a   Xu, Chun Mei ^a  

^a HUNAN UNIVERSITY   (China)

^b CENTRAL SOUTH UNIVERSITY   (China)

^c SUN YAT SEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL THICKNESS; ELECTRONIC DEVICE; FIRST-PRINCIPLES CALCULATION; INTERFACE ATOM; MULTIFERROICS;

CALCULATIONS; ELECTROMAGNETS; FERROELECTRICITY; MAGNETIC MOMENTS; MAGNETOELECTRIC EFFECTS; MAGNETOSTRICTIVE DEVICES;

TUNNEL JUNCTIONS;

EID: 79959386369     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3587172     Document Type: Article

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