Locating faults using multiple spectra-specific models

Proceedings of the ACM Symposium on Applied Computing

Volumn , Issue , 2011, Pages 1404-1410

  Yu, Kai ^a   Lin, Mengxiang ^a   Gao, Qing ^a   Zhang, Hui ^a   Zhang, Xiangyu ^a  

^a BEIHANG UNIVERSITY   (China)

Author keywords

fault localization; multiple models; multiple spectra types; spectra selection; spectra specific model

Indexed keywords

ABNORMAL BEHAVIOR; APPROPRIATE MODELS; DATA DEPENDENCE; FAULT LOCALIZATION; FAULT TYPES; MULTIPLE MODELS; MULTIPLE SPECTRA; PROGRAM SPECTRA; SIEMENS; SPECTRA-SPECIFIC MODEL;

EID: 79959318237     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1982185.1982490     Document Type: Conference Paper

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