SCOPUS 정보 검색 플랫폼

X-Ray Spectrometry

Volumn 40, Issue 4, 2011, Pages 247-253

A critical analysis of the application of EDXRF spectrometry on complex stratigraphies

(7) Bonizzoni, L a Colombo, C b Ferrati, S a Gargano, M a Greco, M b Ludwig, N a Realini, M b

a UNIVERSITY OF MILAN (Italy)

b CNR (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ELEMENTS; ENERGY DISPERSIVE SPECTROSCOPY; X RAY SPECTROMETERS; X RAY TUBES;

CRITICAL ANALYSIS; ENERGY DISPERSIVE X-RAY FLUORESCENCE; MINERAL PIGMENTS; PAINT LAYERS; PICTORIAL LAYERS; PORTABLE ENERGY; TERRACOTTA; X RAY FLUORESCENCE; X-RAY FLUORESCENCE SPECTRUM; X-RAY SPECTROMETERS;

STRATIGRAPHY;

EID: 79959222280 PISSN: 00498246 EISSN: 10974539 Source Type: Journal
DOI: 10.1002/xrs.1320 Document Type: Article

Times cited : (20)

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