Use of Microscopic XRF for Non-destructive Analysis in Art and Archaeometry

X-Ray Spectrometry

Volumn 29, Issue 1, 2000, Pages 73-91

  Janssens, K ^a   Vittiglio, G ^a   Deraedt, I ^a   Aerts, A ^a   Vekemans, B ^a   Vincze, L ^a   Wei, F ^a   Deryck, I ^a   Schalm, O ^a   Adams, F ^a   Rindby, A ^b   Knochel A ^c   Simionovici, A ^d   Snigirev, A ^d  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^c UNIVERSITY OF HAMBURG   (Germany)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ARCHAEOMETRY; CASE-STUDIES; CULTURAL HERITAGES; HERITAGE VALUES; HISTORICAL DOCUMENTS; MICRO-XRF; NON-DESTRUCTIVE ANALYSIS; PROVENANCE ANALYSIS; SYNCHROTRON BEAMLINES; X RAY FLUORESCENCE;

LABORATORIES;

EID: 0034388178     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(200001/02)29:1<73::AID-XRS416>3.0.CO;2-M     Document Type: Article

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