The joined use of n.i. spectroscopic analyses - FTIR, Raman, visible reflectance spectrometry and EDXRF - To study drawings and illuminated manuscripts

Applied Physics A: Materials Science and Processing

Volumn 92, Issue 1, 2008, Pages 103-108

  Bruni, S ^a   Caglio, S ^b   Guglielmi, V ^a   Poldi, G ^b,c  

^a UNIVERSITY OF MILAN   (Italy)

^b Open Care   (Italy)

^c UNIVERSITY OF BERGAMO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MOLECULAR SPECTROSCOPY; RAMAN SPECTROSCOPY; SPECTROSCOPIC ANALYSIS;

IR REFLECTANCE SPECTROMETRY; PORTABLE INSTRUMENTS; REFLECTANCE SPECTROMETRY;

IMAGING TECHNIQUES;

EID: 44749092299     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-008-4454-x     Document Type: Article

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