Infrared and raman spectroscopic studies of optically transparent zirconia (ZrO2) films deposited by plasma-assisted reactive pulsed laser deposition

Applied Spectroscopy

Volumn 65, Issue 5, 2011, Pages 522-527

  Zhang, Wei ^a   Gan, Jie ^a   Hu, Zhigao ^b   Yu, Wenlei ^a   Li, Qian ^a   Sun, Jian ^a   Xu, Ning ^a   Wu, Jiada ^a   Ying, Zhifeng ^a,b  

^a FUDAN UNIVERSITY   (China)

^b EAST CHINA NORMAL UNIVERSITY   (China)

Author keywords

Monoclinic phase; Optical properties; PARPLD; Plasma assisted reactive pulsed laser deposition; Structure; Zirconia; ZrO2 film

Indexed keywords

FOURIER TRANSFORM INFRARED; HIGH TEMPERATURE; INFRARED AND RAMAN SPECTRA; INTERFACIAL LAYER; INTERFACIAL PROPERTY; MONOCLINIC PHASE; OPTICAL CHARACTERIZATION; OPTICAL TRANSMISSION MEASUREMENTS; OPTICAL TRANSPARENCY; PARPLD; RAMAN SPECTROSCOPIC STUDY; REACTIVE PULSED LASER DEPOSITION; SILICON SUBSTRATES; STRUCTURAL CHARACTERIZATION; ZRO2 FILM;

CHARACTERIZATION; FOURIER TRANSFORMS; INFRARED LASERS; LIGHT TRANSMISSION; OPTICAL PROPERTIES; OXIDE FILMS; PLASMA DEPOSITION; PLASMA STABILITY; PULSED LASER DEPOSITION; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILICON COMPOUNDS; SILICON OXIDES; SPECTROSCOPIC ANALYSIS; SPECTROSCOPIC ELLIPSOMETRY; THERMODYNAMIC STABILITY; ULTRAVIOLET LASERS; ZIRCONIA; ZIRCONIUM ALLOYS;

PULSED LASERS;

EID: 79958717151     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/10-06198     Document Type: Article

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