SCOPUS 정보 검색 플랫폼

Volumn 519, Issue 18, 2011, Pages 6190-6195

Characterisation of nano-structured titanium and aluminium nitride coatings by indentation, transmission electron microscopy and electron energy loss spectroscopy

(7) Girleanu M a Pac, M J a Louis, P a Ersen, O b Werckmann, J b Rousselot, C c Tuilier, M H a

a UNIVERSITÉ DE HAUTE ALSACE (France)

b UNIVERSITÉ DE STRASBOURG (France)

c UNIVERSITÉ DE FRANCHE COMTÉ (France)

Author keywords

Electron energy loss near edge structure; Finite element modelling; Indentation; Nitride films; Transmission electron microscopy

Indexed keywords

AL CONTENT; ALN FILMS; CHARACTERISATION; COMPOSITION RANGES; CROSS-SECTION IMAGES; DAMAGE BEHAVIOUR; DEPOSITION PARAMETERS; ELECTRON ENERGY LOSS NEAR EDGE STRUCTURE; ELECTRON ENERGY LOSS SPECTRUM; FINITE ELEMENT MODELLING; GROWTH MODES; INDENTATION TEST; LATTICE SYMMETRY; LOCAL ENVIRONMENTS; LOW STRESS; NANO-STRUCTURED; NITRIDE FILMS; NITROGEN ATOM; RADIOFREQUENCY MAGNETRONS; SMALL GRAINS; STEEL SUBSTRATE; TIN AND TI; TRANSMISSION ELECTRON; VICKERS; VICKERS INDENTATION;

ALUMINUM; ALUMINUM COMPOUNDS; ATOMIC SPECTROSCOPY; DISSOCIATION; ELECTRON ENERGY LEVELS; ELECTRONS; ENERGY DISSIPATION; GRAIN BOUNDARIES; MAGNETRONS; METALLIC FILMS; NANOSTRUCTURES; PROTECTIVE COATINGS; TITANIUM; TITANIUM NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 79958170346 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2011.04.113 Document Type: Article

Times cited : (21)

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