Confocal micro-X-ray fluorescence analysis as a new tool for the non-destructive study of the elemental distributions in pharmaceutical tablets

Talanta

Volumn 85, Issue 1, 2011, Pages 556-561

  Mazel, Vincent ^a   Reiche, Ina ^b   Busignies, Virginies ^a   Walter, Philippe ^b   Tchoreloff, Pierre ^a  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b CENTRE DE RECHERCHE ET DE RESTAURATION DES MUSÉES DE FRANCE   (France)

Author keywords

Chemical imaging; Coating thickness; Confocal X ray fluorescence; Pharmaceutics

Indexed keywords

COATINGS; DEPTH PROFILING; FLUORESCENCE; THICKNESS MEASUREMENT; TITANIUM DIOXIDE; X RAY ABSORPTION; X RAY ANALYSIS;

CHEMICAL IMAGING; COATING THICKNESS; MICRO X-RAY FLUORESCENCE; NON-DESTRUCTIVE MEASUREMENT; PHARMACEUTICAL INDUSTRY; PHARMACEUTICS; PRODUCTION QUALITY CONTROLS; X RAY FLUORESCENCE;

QUALITY CONTROL;

EID: 79958142028     PISSN: 00399140     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.talanta.2011.04.027     Document Type: Article

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