A new lifetime diagnostic system for photovoltaic materials

Solar Energy Materials and Solar Cells

Volumn 95, Issue 8, 2011, Pages 1985-1989

  Ahrenkiel, Richard K ^a   Dunlavy, Donald J ^a  

^a Department of Geology and Geological Engineering   (United States)

Author keywords

Carrier lifetime; Photoconductive decay; Photovoltiacs; Recombination lifetime; Semiconductors; Thin film

Indexed keywords

COMPOUND SEMICONDUCTORS; CONTACT LESS; DIAGNOSTIC SYSTEMS; LIFETIME DATA; MEASUREMENT PROCEDURES; MICROWAVE REFLECTION; MINORITY CARRIER LIFETIMES; NANOCRYSTALLINE SILICON FILMS; NANOCRYSTALLINES; NANOWIRE COMPOSITES; NONINVASIVE TECHNIQUE; PHOTOCONDUCTIVE DECAY; PHOTOVOLTAIC MATERIALS; PHOTOVOLTIACS; RECOMBINATION LIFETIME; RESONANT COUPLED PHOTOCONDUCTIVE DECAYS; SILICON FILMS; SMALL SIGNAL; THIN FILM MATERIAL; TIME RESPONSE;

METALLIC FILMS; NANOCOMPOSITE FILMS; NANOCRYSTALLINE SILICON; NANOWIRES; PHOTOCONDUCTIVITY; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; THIN FILMS;

CARRIER LIFETIME;

EID: 79958141575     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2010.02.037     Document Type: Article

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