Interaction of microwaves with photoelectrons in semiconductors

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 26, Issue 4, 2008, Pages 1508-1515

  Ahrenkiel, R K ^a,b   Johnston, S W ^b  

^a Department of Geology and Geological Engineering   (United States)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKGROUND DOPING; CARRIER DENSITY; INJECTION TECHNIQUES; LIFETIME MEASUREMENTS; ORDERS-OF-MAGNITUDE; PENETRATION DEPTHS; RECOMBINATION LIFETIME; SAMPLE THICKNESS; TRANSMISSION MODES; TRANSMITTED SIGNALS;

CRYSTALS; DISTANCE MEASUREMENT; MICROWAVES; SEMICONDUCTOR MATERIALS;

ELECTRIC CONDUCTIVITY;

EID: 49749132848     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2945296     Document Type: Article

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