Measurement of the refractive index dispersion of As2Se 3 bulk glass and thin films prior to and after laser irradiation and annealing using prism coupling in the near- and mid-infrared spectral range

Review of Scientific Instruments

Volumn 82, Issue 5, 2011, Pages

  Carlie, N ^a   Anheier Jr , N C ^b   Qiao, H A ^b   Bernacki, B ^b   Phillips, M C ^b   Petit, L ^a   Musgraves, J D ^a   Richardson, K ^a  

^a Clemson University   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BULK GLASS; CHALCOGENIDE GLASS; COMMERCIAL SYSTEMS; FILM-DEPOSITION PROCESS; INSTRUMENTAL ERROR; LASER EXPOSURE; LASER SOURCES; MID-INFRARED SPECTRAL RANGE; PRISM COUPLING TECHNIQUE; PRISM COUPLINGS; REFRACTIVE INDEX DISPERSION; REFRACTIVE INDEX UNITS; SPECTRAL REGION; WAVELENGTH REGIONS;

DEPOSITION; GLASS; GLASS LASERS; INFRARED LASERS; LIGHT REFRACTION; PHASE CHANGE MEMORY; PRISMS; REFRACTIVE INDEX; REFRACTOMETERS; SEMICONDUCTING SELENIUM COMPOUNDS; THIN FILMS; VAPOR DEPOSITION;

DISPERSION (WAVES);

EID: 79958074043     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3587616     Document Type: Article

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