Refractive index measurements of planar chalcogenide thin film

Journal of Non-Crystalline Solids

Volumn 328, Issue 1-3, 2003, Pages 183-191

  Laniel, Jacques M ^a   Ménard, Jean Michel ^a   Turcotte, Karine ^a   Villeneuve, Alain ^a,c   Vallée, Réal ^a   Lopez, Cédric ^b   Richardson, Kathleen A ^b,d  

^a UNIVERSITÉ LAVAL   (Canada)

^b UNIVERSITY OF CENTRAL FLORIDA   (United States)

^c ITF Optical Technologies   (Canada)

^d Schott Glass Technologies   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION; GLASS; REFRACTIVE INDEX;

INFRARED COMMUNICATION;

THIN FILMS;

EID: 0141732316     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(03)00527-1     Document Type: Article

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