Photoinduced refractive index change in As2Se3 by 633 nm illumination

Optics Express

Volumn 10, Issue 15, 2002, Pages 639-644

  Van Popta, A C ^a   DeCorby, R G ^a   Haugen, C J ^a   Robinson, T ^a   McMullin, J N ^a   Tonchev, D ^b   Kasap, S O ^b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b UNIVERSITY OF SASKATCHEWAN   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ARSENIC COMPOUNDS; LIGHT ABSORPTION; LIGHTING; OPTICAL GLASS; OPTICAL SWITCHES; REFRACTIVE INDEX; THIN FILMS;

ALL-OPTICAL SWITCHING; OPTICAL CONSTANTS;

PHOTOCHROMISM;

EID: 0038012595     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.10.000639     Document Type: Article

References (21)

1. J. A. Savage, "Optical properties of chalcogenide glasses," J. Non-Cryst. Solids 47, 101-116 (1982).
2. K. Petkov, P. J. S. Ewen, "Photoinduced changes in the linear and non-linear optical properties of chalcogenide glasses," J. Non-Cryst. Solids 249, 150-159 (1999).
3. J. M. Harbold, F. O. Ilday, F. W. Wise, J. S. Sanghera, V. Q. Nguyen, L. B. Shaw, and I. D. Aggarwal, "Highly nonlinear As-S-Se glasses for all-optical switching," Opt. Lett. 27, 119-121 (2002).
4. M. Asobe, H. Kobayashi, and H. Itoh, "Laser-diode-driven ultrafast all-optical switching by using highly nonlinear chalcogenide glass fiber," Opt. Lett. 18, 1056-1058 (1993).
5. A. V. Kolobov and K. Tanaka, "Photoinduced phenomena in amorphous chalcogenides: from phenomenology to nanoscale" in Handbook of advanced electronic and photonic materials and devices, volume 5: chalcogenide glasses and sol-gel materials, H. S. Nalwa, ed. (Academic Press, San Diego, 2001).
6. O. Nordman, N. Nordman, and N. Peyghambarian, "Electron beam induced changes in the refractive index and thin film thickness of amorphous AsxSe100-x and AsxSe100-x films," J. Appl. Phys. 84, 6055-6058 (1998).
7. 3 glass," Appl. Phys. Lett. 65, 2925-2927 (1994).
8. S. Ramachandran, J. C. Pepper, D. J. Brady, and S. G. Bishop, "Micro-optical lenslets by photo-expansion in chalcogenide glasses," J. Lightwave Technol. 15, 1371-1377 (1997).
9. 3 films," J. Non-Cryst. Solids 13, 191-223 (1973/74).
10. J. C. Manifacier, J. Gasiot, and J. P. Fillard, "A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film," J. Phys. E: Sci. Instrum. 9, 1002-1004 (1976).
11. R. Swanepoel, "Determination of the thickness and optical constants of amorphous silicon," J. Phys. E: Sci. Instrum. 16, 1214-1222 (1983).
12. M. Hammam, M. Abdel Harith, and W. H. Osman, "Optical constants of thermally evaporated arsenic triselenide using only transmission spectrum," Solid State Commun. 59, 271-274 (1986).
13. R. Swanepoel, "Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films," J. Phys. E: Sci. Instrum. 17, 896-903 (1984).
14. 3 semiconducting glass films of non-uniform thickness from transmission measurements," Mat. Sci. Eng. B-Solid 25, 53-59 (1994).
15. E. Marquez, J. B. Ramirez-Malo, P. Villares, R. Jimenez-Garay, and R Swanepoel, "Optical characterization of wedge-shaped thin films of amorphous arsenic trisulphide based only on their shrunk transmission spectra," Thin Solid Films 254, 83-91 (1995).
16. 3 thin films using a fiber optic technique," Infrared Phys Techn 38, 227-232 (1997).
17. A. Saliminia, A. Villeneuve, T. V. Galstyan, S. LaRochelle, and K. Richardson, "First- and second-order Bragg gratings in single-mode planar waveguides of chalcogenide glasses," J. Lightwave Technol. 17, 837-842 (1999).
18. C. Corrales, J. B. Ramirez-Malo, J. Fernandez-Pena, P. Villares, R. Swanepoel, and E. Marquez, "Determining the refractive index and average thickness of AsSe semiconducting glass films from wavelength measurements only," Appl. Opt. 34, 7907-7913 (1995).
19. A. E. Owen, "Semiconducting glasses part II: properties and interpretation," Contemp. Phys. 11, 257-286 (1970).
20. A. Ganjoo, K. Shimakawa, "Transient and metastable photodarkening in amorphous chalcogenides," J. Optoelectron. Adv. M. 3, 221-226 (2001).
21. 3 thin films," in Opto-Canada: SPIE Regional Meeting on Optoelectronics, Photonics, and Imaging, SPIE TD01, 126-128 (2002).