Formation of CuIn1 - XAlxSe2 thin films studied by Raman scattering

Thin Solid Films

Volumn 519, Issue 16, 2011, Pages 5329-5334

  Olejnicek J ^a,c   Kamler, C A ^b   Darveau, S A ^a   Exstrom, C L ^a   Slaymaker, L E ^a   Vandeventer, A R ^a   Ianno, N J ^b   Soukup, R J ^b  

^a UNIVERSITY OF NEBRASKA AT KEARNEY   (United States)

^b UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^c INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Chalcopyrites; Copper Aluminium Indium Selenide; Raman Spectroscopy; Solar cells; X ray diffraction

Indexed keywords

ALUMINUM COMPOSITION; CHALCOPYRITES; MICRO RAMAN SPECTROSCOPY; PHONON FREQUENCIES; PRECURSOR FILMS; ROOM TEMPERATURE; SELENIZATION;

COPPER COMPOUNDS; DIFFRACTION; INDIUM; INDUCTIVELY COUPLED PLASMA; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION;

ALUMINUM;

EID: 79958004729     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.02.030     Document Type: Article

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