CuIn1 - xAlxSe2 thin films obtained by selenization of evaporated metallic precursor layers

Thin Solid Films

Volumn 517, Issue 7, 2009, Pages 2240-2243

  Lopez Garcia J ^a   Guillen C ^a  

^a CIEMAT   (Spain)

Author keywords

Chalcopyrite; Cu(In,Al)Se2; Selenization

Indexed keywords

ALUMINUM; COPPER; COPPER COMPOUNDS; CRYSTALLITE SIZE; GRAPHITE; SELENIUM; SOLIDS; THIN FILMS;

AL CONTENTS; BAND-GAP ENERGIES; CHALCOPYRITE; CHALCOPYRITE STRUCTURES; COMPACT STRUCTURES; CU(IN,AL)SE2; ELEMENTAL SELENIUMS; FILM PROPERTIES; GRAIN SIZES; LATTICE PARAMETERS; METALLIC PRECURSORS; POLY-CRYSTALLINE; PRECURSOR LAYERS; SELENIZATION; THIN-FILM MORPHOLOGIES; TWO-STAGE PROCESS;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 58949104747     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.10.095     Document Type: Article

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