Growth and characterization of CuIn1-xAlxSe 2 thin films deposited by co-evaporation

Journal of Physics D: Applied Physics

Volumn 39, Issue 24, 2006, Pages 5124-5132

  Bharath Kumar Reddy, Y ^a   Sundara Raja, V ^a   Sreedhar, B ^b  

^a SRI VENKATESWARA UNIVERSITY   (India)

^b INDIAN INSTITUTE OF CHEMICAL TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; COPPER COMPOUNDS; ELECTRIC CONDUCTIVITY; EVAPORATION; FILM GROWTH; LIGHT ABSORPTION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING INDIUM; STOICHIOMETRY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

CO-EVAPORATION; SODA LIME GLASS SUBSTRATES; SPIN-ORBIT PARAMETERS;

THIN FILMS;

EID: 33846891143     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/39/24/005     Document Type: Article

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