EMap and eSlice: A software package for crystallographic computing

Crystal Research and Technology

Volumn 46, Issue 6, 2011, Pages 569-579

  Oleynikov, P ^a,b  

^a Analitex   (Sweden)

^b STOCKHOLM UNIVERSITY   (Sweden)

Author keywords

electron diffraction; multislice refinement; simulations

Indexed keywords

2D IMAGES; 3D ELECTRON; 3D GRAPHICS; COMPUTER PROGRAM; CONVERGENT-BEAM ELECTRON DIFFRACTION; CRYSTAL STRUCTURE REFINEMENT; DATA INPUT; DIFFERENT MODES; DYNAMICAL EFFECTS; ELECTRON CRYSTALLOGRAPHY; HRTEM IMAGES; KIKUCHI LINES; MULTI SLICES; RECIPROCAL SPACE; SELECTED AREA ELECTRON DIFFRACTION; SIMULATIONS; STRUCTURE FACTORS;

DATA VISUALIZATION; DIFFRACTION PATTERNS; ELECTRON DIFFRACTION; ELECTRONS; GRAPHICAL USER INTERFACES; INTERFEROMETRY; LANTHANUM COMPOUNDS; THREE DIMENSIONAL; THREE DIMENSIONAL COMPUTER GRAPHICS; VISUALIZATION; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION; X RAYS;

CRYSTAL STRUCTURE;

EID: 79957986266     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.201100052     Document Type: Conference Paper

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