A complicated quasicrystal approximant ε16 predicted by the strong-reflections approach

Acta Crystallographica Section B: Structural Science

Volumn 66, Issue 1, 2010, Pages 17-26

  Li, Mingrun ^a   Sun, Junliang ^a   Oleynikov, Peter ^a   Hovmöller, Sven ^a   Zou, Xiaodong ^a   Grushko, Benjamin ^b  

^a STOCKHOLM UNIVERSITY   (Sweden)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Electron diffraction; Inverse Fourier transformation; Quasicrystal approximant; Strong reflections approach

Indexed keywords

APPROXIMANTS; FOURIER TRANSFORMATIONS; INVERSE FOURIER TRANSFORMATION; STRONG-REFLECTIONS APPROACH;

ELECTRON DIFFRACTION; ELECTRONS; FOURIER ANALYSIS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; QUASICRYSTALS; REFLECTION;

FOURIER TRANSFORMS;

EID: 76749089745     PISSN: 01087681     EISSN: 01087681     Source Type: Journal    
DOI: 10.1107/S0108768109053804     Document Type: Article

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