SCOPUS 정보 검색 플랫폼

Journal of the Electrochemical Society

Volumn 158, Issue 7, 2011, Pages

Interface states induced temporary resistance changing behavior in Pt/TiO2/SrTi0.993Nb0.007O3/Pt structure

(5) Lu, Jingquan a Yang, Mei a Hu, Ping a Lv, Qibiao a Li, Shuwei a

a SUN YAT SEN UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAPS; ELECTRICAL BEHAVIORS; ELECTRICAL RESISTANCES; ELECTRICAL STIMULATIONS; ELECTRICAL TESTS; INTERFACE STATE; NEGATIVE DIFFERENTIAL RESISTANCES; PLASMA-ASSISTED MOLECULAR BEAM EPITAXY; RESISTANCE STATE; TRAPPED ELECTRONS; VOLTAGE PULSE;

ELECTRIC POTENTIAL; ELECTRON TRAPS; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; PLATINUM;

IMPACT RESISTANCE;

EID: 79957610536 PISSN: 00134651 EISSN: None Source Type: Journal
DOI: 10.1149/1.3586241 Document Type: Article

Times cited : (8)

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