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Volumn 158, Issue 7, 2011, Pages

Field emission from one-dimensional submicron diamond rods

Author keywords

[No Author keywords available]

Indexed keywords

BORON-DOPED; FIELD-EMISSION CHARACTERISTICS; HIGH CURRENT STRESS; LOW FIELD; OXYGEN PLASMA ETCHING; SHORT PERIODS; SUBMICRON; TURN-ON FIELD; WET-ETCH;

EID: 79957588119     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3592207     Document Type: Article
Times cited : (4)

References (16)
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  • 7
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    • M. Y. Chen, K. Y. Wu, J. Hwang, M. T. Chang, L. J. Chou, and C. S. Kou, Nanotechnology, 18, 455706 (2007). 10.1088/0957-4484/18/45/455706 (Pubitemid 350093277)
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    • Chen, M.Y.1    Wu, K.Y.2    Hwang, J.3    Chang, M.T.4    Chou, L.J.5    Kou, C.S.6
  • 9
    • 12344293790 scopus 로고    scopus 로고
    • Electron field emission characteristics and field evaporation of a single carbon nanotube
    • DOI 10.1021/jp046526d
    • M. S. Wang, L. M. Peng, J. Y. Wang, and Q. Chen, J. Phys. Chem. B, 109, 110 (2005). 10.1021/jp046526d (Pubitemid 40120952)
    • (2005) Journal of Physical Chemistry B , vol.109 , Issue.1 , pp. 110-113
    • Wang, M.S.1    Peng, L.-M.2    Wang, J.Y.3    Chen, Q.4
  • 10
    • 0000476992 scopus 로고    scopus 로고
    • Negative electron affinity mechanism for diamond surfaces
    • DOI 10.1063/1.121422, PII S0003695198031209
    • I. L. Krainsky and V. M. Asnin, Appl. Phys. Lett., 72, 2574 (1998). 10.1063/1.121422 (Pubitemid 128671580)
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  • 13
    • 0001599322 scopus 로고    scopus 로고
    • Comparison of electric field emission from nitrogen-doped, type Ib diamond, and boron-doped diamond
    • DOI 10.1063/1.116168, PII S0003695196029167
    • M. W. Geis, J. C. Twichell, N. N. Efremow, K. Krohn, and T. M. Lyszczarz, Appl. Phys. Lett., 68, 2294 (1996). 10.1063/1.116168 (Pubitemid 126683790)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.