Atomic force acoustic microscopy for quantitative nanomechanical characterization

Wear

Volumn 271, Issue 3-4, 2011, Pages 534-538

  Marinello, F ^a,b   Schiavuta, P ^b   Vezzu S ^b   Patelli, A ^b   Carmignato, S ^a   Savio, E ^a  

^a UNIVERSITY OF PADOVA   (Italy)

^b Associazione CIVEN   (Italy)

Author keywords

AFAM; Atomic force acoustic microscopy; Contact mechanics; Nanoindentation

Indexed keywords

AFAM; ATOMIC FORCE ACOUSTIC MICROSCOPY; CONTACT MECHANICS; HIGH-LATERAL RESOLUTION; LOCAL ELASTIC PROPERTIES; MEASUREMENT TECHNIQUES; NANOINDENTATION TECHNIQUES; NANOMECHANICAL CHARACTERIZATION; PLASMA ENHANCED CHEMICAL VAPOUR DEPOSITION; QUANTITATIVE MEASUREMENT; SCANNING PROBE INSTRUMENT;

ACOUSTIC MICROSCOPES; ACOUSTIC VARIABLES MEASUREMENT; CHEMICAL VAPOR DEPOSITION; MATERIALS PROPERTIES; NANOINDENTATION; PLASMA DEPOSITION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;

ATOMS;

EID: 79957454220     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.wear.2010.03.032     Document Type: Article

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