Planning for accelerated life tests

International Journal of Reliability, Quality and Safety Engineering

Volumn 6, Issue 3, 1999, Pages 265-275

  Tang, Loon Ching ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Accelerated life testing; Constant stress; Optimization; Step stress; Test planning

Indexed keywords

EID: 0006489120     PISSN: 02185393     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218539399000255     Document Type: Article

References (1)

1. D. S. Bai and M. S. Kim, "Optimum simple step-stress accelerated life tests for Weibull distribution and Type I censoring," Naval Research Logistics 40 (1993), pp. 193-210.