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Volumn 352, Issue 1-2, 1999, Pages 73-76

Thin films of tetragonal zirconia with Bi doping: Deposition, characterisation and thermal behaviour

Author keywords

Chemical vapour deposition; Oxides; X ray diffraction; X ray photoelectron spectroscopy

Indexed keywords


EID: 0003093015     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00356-9     Document Type: Article
Times cited : (6)

References (20)
  • 10
    • 0347256124 scopus 로고    scopus 로고
    • American Society for Testing and Material, Powder Diffraction Files, Joint Committee on Powder Diffraction Standards, USA, #24-1164
    • American Society for Testing and Material, Powder Diffraction Files, Joint Committee on Powder Diffraction Standards, USA, #24-1164.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.