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Volumn 44, Issue 21, 2011, Pages

Fabrication and study of laser-damage-resistant transparent conductive W-doped In2O3 films

Author keywords

[No Author keywords available]

Indexed keywords

1064 NM; BAND GAPS; ELECTRONIC CONDUCTIVITY; LASER ABSORPTION; LASER DAMAGE RESISTANCE; LASER INDUCED DAMAGE THRESHOLDS; LASER-INDUCED DAMAGE; LOW CARRIER DENSITY; LOW RESISTIVITY; NEAR INFRARED REGION; OPTICAL TRANSMITTANCE; POLYCRYSTALLINE; PREFERENTIAL ORIENTATION; QUARTZ GLASS SUBSTRATES; TRANSPARENT CONDUCTIVE; TRANSPARENT CONDUCTIVE OXIDE FILMS; VISIBLE RANGE;

EID: 79956092032     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/44/21/215101     Document Type: Article
Times cited : (12)

References (22)
  • 1
    • 0030706222 scopus 로고    scopus 로고
    • Thomas G 1997 Nature 389 907
    • (1997) Nature , vol.389 , Issue.6654 , pp. 907
    • Thomas, G.1
  • 5
    • 0038136910 scopus 로고    scopus 로고
    • Wager J F 2003 Science 300 1245
    • (2003) Science , vol.300 , Issue.5623 , pp. 1245
    • Wager, J.F.1
  • 18
    • 79956126649 scopus 로고    scopus 로고
    • ISO 11254-1-2000 Laser and laser-related equipment-Determination of laser-induced damage threshold of optical surface-part 1: 1-on-1 test
    • ISO 11254-1-2000 Laser and laser-related equipment-Determination of laser-induced damage threshold of optical surface-part 1: 1-on-1 test


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.