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Volumn 80, Issue 20, 2002, Pages 3751-3753

Determination of the barrier-height fluctuations based on the parallel-noninteracting diode model

Author keywords

[No Author keywords available]

Indexed keywords

BARRIER HEIGHTS; GENERAL EXPRESSION; I - V CURVE; PARALLEL DIODES; PROBABILITY OF OCCURRENCE; SCHOTTKY EFFECT; SCHOTTKY JUNCTIONS; SERIES RESISTANCES; SOLID STATE ELECTRONICS;

EID: 79956057564     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1480882     Document Type: Article
Times cited : (4)

References (16)
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    • R. T. Tung, Appl. Phys. Lett. 58, 2821 (1991). apl APPLAB 0003-6951
    • (1991) Appl. Phys. Lett. , vol.58 , pp. 2821
    • Tung, R.T.1
  • 6
    • 0030190842 scopus 로고    scopus 로고
    • jaJAPIAU 0021-8979
    • S. Chand and J. Kumar, J. Appl. Phys. 80, 288 (1996). jap JAPIAU 0021-8979
    • (1996) J. Appl. Phys. , vol.80 , pp. 288
    • Chand, S.1    Kumar, J.2
  • 7
    • 0000580593 scopus 로고    scopus 로고
    • jaJAPIAU 0021-8979
    • S. Chand and J. Kumar, J. Appl. Phys. 82, 5005 (1997). jap JAPIAU 0021-8979
    • (1997) J. Appl. Phys. , vol.82 , pp. 5005
    • Chand, S.1    Kumar, J.2
  • 8
  • 14
    • 0034205920 scopus 로고    scopus 로고
    • asu ASUSEE 0169-4332
    • K. Maeda, Appl. Surf. Sci. 159, 154 (2000). asu ASUSEE 0169-4332
    • (2000) Appl. Surf. Sci. , vol.159 , pp. 154
    • Maeda, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.