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Volumn 80, Issue 20, 2002, Pages 3751-3753
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Determination of the barrier-height fluctuations based on the parallel-noninteracting diode model
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Author keywords
[No Author keywords available]
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Indexed keywords
BARRIER HEIGHTS;
GENERAL EXPRESSION;
I - V CURVE;
PARALLEL DIODES;
PROBABILITY OF OCCURRENCE;
SCHOTTKY EFFECT;
SCHOTTKY JUNCTIONS;
SERIES RESISTANCES;
SOLID STATE ELECTRONICS;
DIODES;
ELECTRIC RESISTANCE;
PROBABILITY DISTRIBUTIONS;
CURRENT VOLTAGE CHARACTERISTICS;
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EID: 79956057564
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1480882 Document Type: Article |
Times cited : (4)
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References (16)
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