Quantitative nonlinear dielectric microscopy of periodically polarized ferroelectric domains

Applied Physics Letters

Volumn 73, Issue 8, 1998, Pages 1146-1148

  Gao, Chen ^a   Duewer, Fred ^a   Lu, Yalin ^a   Xiang, X D ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005325220     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122111     Document Type: Article

References (9)

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7. C. Gao and X.-D. Xiang (unpublished).
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