A stem parallel diffraction technique applied to nanomaterials

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 752-753

  Ganesh, K J ^a   Kawasaki, M ^b   Zhou, J P ^a   Ferreira, P J ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b JEOL USA INC   (United States)

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EID: 69949139418     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609096354     Document Type: Article

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