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Applied Physics Letters

Volumn 80, Issue 3, 2002, Pages 407-409

Nanostructure of sol-gel films by X-ray specular reflectivity

(3) Morelhao S L a Brito, G E S a Abramof, E b

a UNIVERSITY OF SÃO PAULO (Brazil)

b INSTITUTO NACIONAL DE PESQUISAS ESPACIAIS (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENCE PROPERTIES; CURRENT QUALITY; DENSITY PROFILE; LOW COSTS; OPTICAL APPLICATIONS; PREPARATION PROCESS; SOLGEL FILMS; STRUCTURAL CHARACTERIZATION; X-RAY SPECULAR REFLECTIVITY;

ERBIUM; FILM PREPARATION; GELS; METALLIC FILMS; NANOSTRUCTURES; REFLECTION; SOL-GELS; SOLS;

SOL-GEL PROCESS;

EID: 79955996877 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1436271 Document Type: Article

Times cited : (18)

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