SAXS measurements of the porosity in Cu(II)-doped SnO2 xerogels during crystallization

Journal of Non-Crystalline Solids

Volumn 217, Issue 1, 1997, Pages 41-47

  Brito, G E S ^a   Santilli, C V ^a   Pulcinelli, S H ^a   Craievich, A F ^b,c  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

^c UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; DIFFUSION IN SOLIDS; DOPING (ADDITIVES); HEAT TREATMENT; INTERFACES (MATERIALS); MORPHOLOGY; PARTICLE SIZE ANALYSIS; POROSITY; POROUS MATERIALS; REACTION KINETICS; X RAY ANALYSIS;

MONOLITHIC XEROGELS; SMALL ANGLE X RAY SCATTERING (SAXS);

SOL-GELS;

EID: 0031549247     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(97)00137-3     Document Type: Article

References (10)

1. C.J. Brinker, G.W. Scherrer, Sol-Gel Science, The Physics and Chemistry of Sol-Gel Processing (Academic Press, San Diego, 1990) ch. 9 and 11.
2. C.V. Santilli, S.H. Pulcinelli, A.F. Craievich, Phys. Rev. B51 (1995) 8801.
3. G.E.S. Brito, S.H. Pulcinelli, C.V. Santilli, A.F., Craievich, J. Appl. Crystallogr. (1997), in press.
4. H.J. Furukawa, J. Appl. Crystallogr. 21 (1988) 805.
5. N. Dolet, J.M. Heintz, L. Rabardeel, M. Onillon, J.P. Bonet, J. Mater. Sci. 30 (1995) 365.
6. R.S. Hiratsuka, C.V. Santilli, D.V. Silva, S.H. Pulcinelli, J. Non-Cryst. Solids 147&148 (1992) 67.
7. L.C. Klein, Sol-Gel Technology for Thin Films, Fibers, Preforms, Eletronics and Speciality Shapes (Noyes, NJ, 1988) p. 382.
8. G.E.S. Brito, V. Briois, S.H. Pulcinelli, C.V. Santilli, J. Sol-Gel Sci. Tech. 8 (1997) 269.
9. G. Porod, Small Angle X-Ray Scattering (Gordon and Breach, New York, 1967) p. 1.
10. R. Yamamoto, K. Nakanishi, Phys. Rev. B51 (1995) 2715.