Systematic examination of carrier polarity in composition spread ZnO thin films codoped with Ga and N

Applied Physics Letters

Volumn 81, Issue 2, 2002, Pages 235-237

  Tsukazaki, A ^a   Saito, H ^a   Tamura, K ^a   Ohtani, M ^a   Koinuma, H ^a   Sumiya, M ^b   Fuke, S ^b   Fukumura, T ^c   Kawasaki, M ^c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b SHIZUOKA UNIVERSITY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CO-DOPED; CO-DOPING; COMPOSITION SPREAD; CRYSTAL TARGET; HALL BARS; LATTICE-MATCHED; P-TYPE; P-TYPE CONDUCTION; ZNO THIN FILM;

CRYSTAL IMPURITIES; DEPOSITION; ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; GALLIUM; GRADIENT METHODS; METALLIC FILMS; OPTICAL FILMS; PULSED LASER DEPOSITION; SEMICONDUCTOR DOPING; SEMICONDUCTOR QUANTUM WELLS; SILICON WAFERS; SINGLE CRYSTALS; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION; ZINC OXIDE;

GALLIUM ALLOYS;

EID: 79955984141     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1491294     Document Type: Article

References (21)

1. P. Yu, Z. K. Tang, G. K. L. Wong, M. Kawasaki, A. Ohtomo, H. Koinuma, and Y. Segawa, Solid State Commun. 103, 459 (1997). ssc SSCOA4 0038-1098
2. Z. K. Tang, G. K. L. Wong, P. Yu, M. Kawasaki, A. Ohtomo, H. Koinuma, and Y. Segawa, Appl. Phys. Lett. 72, 3270 (1998). apl APPLAB 0003-6951
3. D. M. Bagnell, Y. F. Chen, Z. Zhu, T. Yao, S. Koyama, M. Y. Shen, and T. Goto, Appl. Phys. Lett. 70, 2230 (1997). apl APPLAB 0003-6951
4. H. D. Sun, T. Makino, N. T. Tuan, Y. Segawa, Z. K. Tang, G. K. L. Wong, M. Kawasaki, A. Ohtomo, K. Tamura, and H. Koinuma, Appl. Phys. Lett. 77, 4250 (2000). apl APPLAB 0003-6951
5. A. Ohtomo, K. Tamura, T. Makino, Y. Segawa, Z. K. Tang, K. L. Wong, Y. Matsumoto, H. Koinuma, and M. Kawasaki, Appl. Phys. Lett. 77, 2204 (2000). apl APPLAB 0003-6951
6. K. Hümmer, Phys. Status Solidi B 56, 249 (1973). psb PSSBBD 0370-1972
7. K. Minegishi, Y. Koiwai, Y. Kikuchi, K. Yano, M. Kasuga, and A. Shimizu, Jpn. J. Appl. Phys., Part 2 36, L1453 (1997). jjc JAPLD8 0021-4922
8. X.-L. Guo, H. Tabata, and T. Kawai, J. Cryst. Growth 233, 135 (2001). jcr JCRGAE 0022-0248
9. Y. R. Ryu, S. Zhu, D. C. Look, J. M. Wrobel, H. M. Joeng, and H. W. White, J. Cryst. Growth 216, 330 (2000). jcr JCRGAE 0022-0248
10. T. Yamamoto and H. K. Yoshida, Jpn. J. Appl. Phys., Part 2 38, L166 (1999). jjc JAPLD8 0021-4922
11. M. Joseph, H. Tabata, and T. Kawai, Jpn. J. Appl. Phys., Part 2 38, L2505 (1999). jjc JAPLD8 0021-4922
12. M. Kawasaki, K. Tamura, K. Saikusa, T. Aita, A. Tsukazaki, A. Ohtomo, Z. G. Jin, Y. Matsumoto, T. Fukumura, H. Koinuma, Y. Ohmaki, S. Kishimoto, Y. Ohno, F. Matsukura, H. Ohno, T. Makino, N. T. Tuan, H. D. Sun, C. H. Chia, Y. Segawa, Z. K. Tang, and G. K. L. Wang, Ext. Abstract of 2000 Int'l. Conference on Solid State Devices and Materials, Sendai, Japan, 2000, p. 128. This claim was made based on unproper Hall measurements and the data were wrong as reported in the oral presentation of the conference and the annual meeting of Japanese Applied Physics Society, Sapporo, Japan, September, 2000 (unpublished).
13. X. L. Guo, J. H. Choi, H. Tabata, and T. Kawai, Jpn. J. Appl. Phys., Part 2 40, L177 (2001). jjc JAPLD8 0021-4922
14. T. Aoki, Y. Hatanaka, and D. C. Look, Appl. Phys. Lett. 76, 3257 (2000). apl APPLAB 0003-6951
15. Y. R. Ryu, W. J. Kim, and H. W. White, J. Cryst. Growth 219, 419 (2000). jcr JCRGAE 0022-0248
16. A. Zunger (private communication).
17. A. Ohtomo, K. Tamura, K. Saikusa, K. Takahashi, T. Makino, Y. Segawa, H. Koinuma, and M. Kawasaki, Appl. Phys. Lett. 75, 2635 (1999). apl APPLAB 0003-6951
18. A. Ohtomo, M. Kawasaki, T. Koida, K. Masubuchi, H. Koinuma, Y. Sakurai, Y. Yoshida, T. Yasuda, and Y. Segawa, Appl. Phys. Lett. 72, 2466 (1998). apl APPLAB 0003-6951
19. K. Tamura, A. Ohtomo, K. Saikusa, Y. Osaka, T. Makino, Y. Segawa, M. Sumiya, S. Fuke, H. Koinuma, and M. Kawasaki, J. Cryst. Growth 214, 59 (2000). jcr JCRGAE 0022-0248
20. M. Ohtani, T. Fukumura, M. Kawasaki, K. Omote, T. Kikuchi, J. Harada, A. Ohtomo, M. Lippmaa, T. Ohnishi, D. Komiyama, R. Takahashi, Y. Matsumoto, and H. Koinuma, Appl. Phys. Lett. 79, 3594 (2001). apl APPLAB 0003-6951
21. T. Makino, T. Yasuda, Y. Segawa, A. Ohtomo, K. Tamura, M. Kawasaki, and H. Koinuma, Appl. Phys. Lett. 79, 1282 (2001). apl APPLAB 0003-6951