Measuring the mobility of single crystalline wires and its dependence on temperature and carrier density

Journal of Physics Condensed Matter

Volumn 23, Issue 20, 2011, Pages

  Amorim, Cleber A ^a   Berengue, Olivia M ^a   Kamimura, Hanay ^a   Leite, Edson R ^a   Chiquito, Adenilson J ^a  

^a FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC PHONONS; CARRIER DENSITY; COMPREHENSIVE ANALYSIS; ELECTRON TRANSPORT; ELECTRONIC NANODEVICES; FIELD EFFECTS; HALL GEOMETRY; HIGH TEMPERATURE; IONIZED IMPURITIES; KINETIC TRANSPORT; LOW TEMPERATURES; NANOSCALE ELECTRONICS; NEW RESULTS; SCATTERING MECHANISMS; SEMICONDUCTOR TRANSPORT; SINGLE-CRYSTALLINE; SINGLE-CRYSTALLINE WIRES; TEMPERATURE DEPENDENCE; VARIABLE RANGE HOPPING;

CARRIER CONCENTRATION; ELECTRON MOBILITY; NANOSTRUCTURED MATERIALS; PARAMETER EXTRACTION; STATISTICAL MECHANICS;

CRYSTALLINE MATERIALS;

EID: 79955921149     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/23/20/205803     Document Type: Article

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