Local electrostatic effects of surface structure on field emission

Journal of Applied Physics

Volumn 93, Issue 1, 2003, Pages 691-697

  Jaeger, D L ^a   Hren, J J ^a   Zhirnov, V V ^a,b  

^a North Carolina State University   (United States)

^b SEMICONDUCTOR RESEARCH CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; ERRORS; FINITE ELEMENT METHOD; MORPHOLOGY; SURFACE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

FIELD EMISSION NEEDLES;

ELECTROSTATICS;

EID: 0037260453     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1526934     Document Type: Article

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