PEDOT:PSS Schottky contacts on annealed ZnO films

Chinese Physics B

Volumn 20, Issue 4, 2011, Pages

  Zhu, Ya Bin ^a   Hu, Wei ^a   Na, Jie ^a   He, Fan ^a   Zhou, Yue Liang ^b   Chen, Cong ^b  

^a BEIJING JIAOTONG UNIVERSITY   (China)

^b INSTITUTE OF PHYSICS   (China)

Author keywords

annealed ZnO film; rectifying characteristic; Schottky contacts

Indexed keywords

BARRIER HEIGHTS; CURRENT-VOLTAGE MEASUREMENTS; IDEALITY FACTORS; ITO FILMS; METAL ELECTRODES; ORDERS OF MAGNITUDE; PEDOT:PSS; POLY(3 ,4-ETHYLENEDIOXYTHIOPHENE); POLY(STYRENE SULFONATE); POLYCRYSTALLINE ZNO; RADIO FREQUENCIES; REACTIVE MAGNETRON SPUTTERING; RECTIFYING CHARACTERISTIC; SCHOTTKY CONTACTS; SEMICONDUCTOR FIELD-EFFECT TRANSISTORS; UV PHOTODETECTORS; ZNO FILMS;

ANNEALING; ATOMIC FORCE MICROSCOPY; CONDUCTING POLYMERS; CONDUCTIVE FILMS; DISTILLATION; FIELD EFFECT TRANSISTORS; METALLIC FILMS; OPTOELECTRONIC DEVICES; ORGANIC CONDUCTORS; POLYMER FILMS; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; X RAY DIFFRACTION;

ZINC OXIDE;

EID: 79955699435     PISSN: 16741056     EISSN: None     Source Type: Journal    
DOI: 10.1088/1674-1056/20/4/047301     Document Type: Article

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