Electrical scanning probe microscopy of an integrated blocking layer

Journal of Nanoscience and Nanotechnology

Volumn 10, Issue 10, 2010, Pages 6840-6844

  Weber, Stefan A L ^a   Memesa, Mine ^a   Berger, Rüdiger ^a   Butt, Hans Jürgen ^a   Gutmann, Jochen S ^a,b  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^b JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

Blocking layer; Conductive scanning force microscopy; Hybrid solar cell; Scanning Kelvin probe microscopy

Indexed keywords

AMPHIPHILIC TRIBLOCK COPOLYMERS; ANATASE TITANIA; ANNEALED SAMPLES; AVERAGE VALUES; BLOCKING LAYERS; CONDUCTING STRUCTURE; CONDUCTIVE SCANNING FORCE MICROSCOPY; ELECTRICAL SCANNING PROBE MICROSCOPY; GRANULAR STRUCTURESS; HYBRID SOLAR CELL; KELVIN PROBE MICROSCOPY; ORGANIC SOLAR CELL; PLASMA TREATMENT; SCANNING FORCE MICROSCOPY; SCANNING KELVIN PROBE MICROSCOPY; SOL-GEL CHEMISTRY; THERMAL TREATMENT; TITANIA; TITANIA GRAINS;

BLOCK COPOLYMERS; NANOCOMPOSITES; PLASMA APPLICATIONS; PROBES; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SOLAR CELLS; TITANIUM DIOXIDE;

SCANNING;

EID: 79955530590     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2010.2974     Document Type: Conference Paper

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