Phase mixture and reliability of BaTiO3-based X7R multilayer ceramic capacitors: X-ray diffractometry and Raman spectroscopy

Journal of the American Ceramic Society

Volumn 94, Issue 5, 2011, Pages 1556-1562

  Lee, Hwan Wen ^a   Chu, Mike S H ^b,c   Lu, Hong Yang ^a  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^b TAM Ceramics LLC   (United States)

^c Ferro Electronic Material Systems   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BASE-METAL ELECTRODES; CO-DOPING; CORE REGION; CORE-SHELL GRAINS; CRYSTALLINE PHASE; CRYSTALLINE PHASIS; DIELECTRIC BEHAVIOR; MULTI-LAYER CERAMIC CAPACITOR; MULTILAYER CERAMIC CAPACITORS; PHASE CONTENT; PHASE IDENTIFICATION; PHASE MIXTURE; PHONON VIBRATION MODE; R PHASE; TEMPERATURE COEFFICIENT OF CAPACITANCE; X RAY DIFFRACTOMETRY;

BARIUM COMPOUNDS; CAPACITORS; CERAMIC CAPACITORS; CERAMIC MATERIALS; CRYSTALLINE MATERIALS; DIFFRACTION; MULTILAYERS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; RIETVELD METHOD; RIETVELD REFINEMENT; SHELLS (STRUCTURES);

ELECTROLYTIC CAPACITORS;

EID: 79955505631     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2010.04248.x     Document Type: Article

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