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Volumn 90, Issue 9, 2007, Pages 2926-2934

Dielectric behavior and second phases in X7R-formulated BaTiO3 sintered in low-oxygen partial pressures

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM ALLOYS; ELECTROCHEMICAL ELECTRODES; GRAIN GROWTH; PARTIAL PRESSURE; PERMITTIVITY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 34548488692     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2007.01763.x     Document Type: Article
Times cited : (8)

References (37)
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    • Base-Metal Electrode-Multilayer Ceramic Capacitors: Past, Present and Future Perspectives
    • H. Kishi, Y. Mizuno H. Chazono Base-Metal Electrode-Multilayer Ceramic Capacitors: Past, Present and Future Perspectives Jpn. J. Appl. Phys., 42 part I] 1 15 (2003).
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  • 6
    • 0035455045 scopus 로고    scopus 로고
    • Dc-Electrical Degradation of the BT-based Material for Multilayer Ceramic Capacitor with Ni Internal Electrode: Impedance Analysis and Microstructure
    • H. Chazono H. Kishi dc-Electrical Degradation of the BT-based Material for Multilayer Ceramic Capacitor with Ni Internal Electrode: Impedance Analysis and Microstructure Jpn. J. Appl. Phys., 40 [9B Part I] 5624 29 (2001).
    • (2001) Jpn. J. Appl. Phys. , vol.40 , Issue.91 , pp. 5624-29
    • Chazono, H.1    Kishi, H.2
  • 7
    • 0025448039 scopus 로고
    • Dc Electrical Degradation of Perovskite-Type Titanates: I, Ceramics
    • R. Waser, T. Baiatu K. H. Härdtl dc Electrical Degradation of Perovskite-Type Titanates: I, Ceramics J. Am. Ceram. Soc., 73 [6] 1645 53 (1990).
    • (1990) J. Am. Ceram. Soc. , vol.73 , Issue.6 , pp. 1645-53
    • Waser, R.1    Baiatu, T.2    Härdtl, K.H.3
  • 16
    • 0035248787 scopus 로고    scopus 로고
    • Atomic Simulation of Dopant Incorporation in Barium Titanate
    • M. T. Buscaglia, V. Buscaglia M. Viviani Atomic Simulation of Dopant Incorporation in Barium Titanate J. Am. Ceram. Soc., 84 [2] 376 84 (2001).
    • (2001) J. Am. Ceram. Soc. , vol.84 , Issue.2 , pp. 376-84
    • Buscaglia, M.T.1    Buscaglia, V.2    Viviani, M.3
  • 18
    • 34548509987 scopus 로고
    • Silicate Apatite and Oxyapatite
    • J. Ito Silicate Apatite and Oxyapatite Am. Mineral., 33 [5-6] 890 907 (1961).
    • (1961) Am. Mineral. , vol.33 , Issue.56 , pp. 890-907
    • Ito, J.1
  • 22
    • 33645116762 scopus 로고    scopus 로고
    • 2 Dependence of the Diffuse Phase Transition in Base Metal Capacitor Dielectrics
    • 2 Dependence of the Diffuse Phase Transition in Base Metal Capacitor Dielectrics J. Am. Ceram. Soc., 89 [1] 193 201 (2006).
    • (2006) J. Am. Ceram. Soc. , vol.89 , Issue.1 , pp. 193-201
    • McCauley, D.E.1    Chu, M.S.H.2    Megherhi, M.H.3
  • 24
    • 33644667535 scopus 로고    scopus 로고
    • Effect of Oxygen Partial Pressure on the Dielectric Properties and Microstructures of Cofired Base-Metal Electrode Multilayer Ceramic Capacitors
    • Q. Fang, C. J. McConville, D. D. Edwards, D. E. McCauley M. S. H. Chu Effect of Oxygen Partial Pressure on the Dielectric Properties and Microstructures of Cofired Base-Metal Electrode Multilayer Ceramic Capacitors J. Am. Ceram. Soc., 89 [3] 894 901 (2006).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.