Structure-property relationship in BT-based dielectrics for Ni-MLCC: Modification of grain boundary

International Journal of Applied Ceramic Technology

Volumn 2, Issue 1, 2005, Pages 45-50

  Chazono, Hirokazu ^a   Hagiwara, Tomoya ^a  

^a TAIYO YUDEN CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE; CERAMIC CAPACITORS; CHEMICAL MODIFICATION; COMPOSITION EFFECTS; CRYSTAL STRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; DIELECTRIC PROPERTIES; ELECTRODES; GRAIN BOUNDARIES; HOLMIUM COMPOUNDS; NICKEL; TEMPERATURE MEASUREMENT;

MULTILAYER CERAMIC CAPACITORS (MLCC); NICKEL INTERNAL ELECTRODE; STRUCTURE-PROPERTY RELATIONSHIP;

DIELECTRIC MATERIALS;

EID: 15044362856     PISSN: 1546542X     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1744-7402.2005.02002.x     Document Type: Article

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