Absorption imaging of ultracold atoms on atom chips

Optics Express

Volumn 19, Issue 9, 2011, Pages 8471-8485

  Smith, David A ^a   Aigner, Simon ^b   Hofferberth, Sebastian ^b,c   Gring, Michael ^a   Andersson, Mauritz ^b,d   Wildermuth, Stefan ^b   Krüger, Peter ^b,e   Schneider, Stephan ^a   Schumm, Thorsten ^a   Schmiedmayer, Jörg ^a,b  

^a TU WIEN   (Austria)

^b UNIVERSITY OF HEIDELBERG   (Germany)

^c HARVARD UNIVERSITY   (United States)

^d ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^e UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

GAS FUEL ANALYSIS; MAGNETIC FIELDS;

ABSORPTION IMAGING; ATOM CHIPS; ATOM-SURFACE DISTANCES; CRITICAL FACTORS; MAGNETIC FIELD IMAGING; ULTRACOLD ATOMIC GAS; ULTRACOLD ATOMS;

ATOMS;

ABSORPTION; ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; GAS;

ABSORPTION; COMPUTER SIMULATION; GASES; MODELS, CHEMICAL;

EID: 79955417176     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.008471     Document Type: Article

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