Bose-Einstein condensates: Microscopic magnetic-field imaging

Nature

Volumn 435, Issue 7041, 2005, Pages 440-

  Wildermuth, Stephan ^a   Hofferberth, Sebastian ^a   Lesanovsky, Igor ^a   Haller, Elmar ^a   Andersson, L Mauritz ^a   Groth, Sönke ^a,b   Bar Joseph, Israel ^b   Krüger, Peter ^a   Schmiedmayer, Jörg ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

NANOPARTICLE; SILICON;

IMAGING METHOD; MAGNETIC FIELD; PHYSICS;

ARTICLE; CAMERA; CONDUCTOR; ELECTRICITY; IMAGING; MAGNETIC FIELD; MICROSCOPY; PRIORITY JOURNAL; SENSOR; TEMPERATURE;

EID: 21144436935     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/435440a     Document Type: Article

References (12)

1. Bending, S. J. Adv. Phys. 48, 499-535 (1999).
2. Freeman, M. R. & Choi, B. C. Science 294, 1484-1488 (2001).
3. Faley, M. I. et al. Supercond Sci. Technol. 17, 324-327(2004).
4. Kominis, I. K., Kornack, T. W., Allred, J. C. & Romalis, M. V. Nature 422, 596-599 (2003).
5. Fortagh, J., Ott, H., Kraft. S., Günther, A. & Zimmermann, C. Phys. Rev. A 66, 041604 (2002).
6. Esteve, J. et al. Phys. Rev. A 70, 043629 (2004).
7. Leanhardt, A. E. et al. Phys. Rev. left, 89, 040401 (2002).
8. Jones, M. P. A. et al. Phys. Rev. Lett. 91, 080401 (2003).
9. Dunjko, V., Lorent, V. & Olshanii, M. Phys. Rev. Lett. 86, 5413-5416 (2001).
10. Folman, R., Krüger, P., Schmiedmayer, J., Denschlag, J. & Henkel, C. Adv. At. Mol. Opt. Phys. 48, 263-356 (2002).
11. Rous, P. J., Yongsunthon, R., Stanishevsky, A. & Williams, E. D. J. Appl. Phys. 95, 2477-2486 (2004).
12. Oral, A. et al. IEEE Trans. Magn. 38, 2438-2440 (2002).