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Volumn 70, Issue 4, 2004, Pages

Role of wire imperfections in micromagnetic traps for atoms

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; DATA REDUCTION; ELECTROPLATING; HARMONIC ANALYSIS; IMAGE ANALYSIS; INTERFEROMETERS; MAGNETIC FIELDS; MICROELECTRONICS; OPTICAL PUMPING; PHOTORESISTS; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; TITANIUM;

EID: 19744381189     PISSN: 10502947     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevA.70.043629     Document Type: Article
Times cited : (111)

References (15)
  • 15
    • 85015772723 scopus 로고    scopus 로고
    • note
    • Measurements by the Heidelberg group of an atom chip produced by photolithography and gold evaporation indicates reduced potential roughness compared to other observations. J. Schmiedmayer (private communication); S. Groth et al., e-print cond-mat/0404141.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.