Atom chips: Fabrication and thermal properties

Applied Physics Letters

Volumn 85, Issue 14, 2004, Pages 2980-2982

  Groth, S ^a   Kruger P ^a   Wildermuth, S ^a   Folman, R ^a   Fernholz, T ^a   Schmiedmayer, J ^a   Mahalu, D ^b   Bar Joseph, I ^b  

^a UNIVERSITY OF HEIDELBERG   (Germany)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; DATA ACQUISITION; ELECTROPLATING; LITHOGRAPHY; QUANTUM OPTICS; SEMICONDUCTING GALLIUM ARSENIDE; SILICON; ULTRAVIOLET RADIATION;

ATOM IMAGING; BOSE-EINSTEN CONDENSATES; LASER COOLING; SURFACE MOUNTED MICROSCOPIC CURRENTS;

MICROPROCESSOR CHIPS;

EID: 8444230923     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1804601     Document Type: Article

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