Magnetic force microscopy on nanocrystalline co films

Journal of Nanoscience and Nanotechnology

Volumn 10, Issue 9, 2010, Pages 6120-6127

  Karoutsos, Vangelis ^a   Poulopoulos, Panagiotis ^a   Kapaklis, Vassilios ^a,b   Pappas, Spiridon D ^a   Trachylis, Dimitrios ^a   Politis, Constantin ^a  

^a UNIVERSITY OF PATRAS   (Greece)

^b UPPSALA UNIVERSITY   (Sweden)

Author keywords

Cobalt; Magnetic Force Microscopy; Magneto Optic Kerr Effect; Sputtering; Thin Films

Indexed keywords

AMORPHOUS STRUCTURES; CO FILMS; CORNING GLASS; DEMAGNETIZED STATE; DOMAIN CONFIGURATIONS; FILM PLANES; HEXAGONAL CLOSE PACKED; INTERFACE ANISOTROPY; MAGNETIC FORCE; MAGNETIZATION LOOPS; MAGNETO-OPTIC KERR EFFECT; MAGNETOELASTIC ANISOTROPY; NANOCRYSTALLINE CO; PERPENDICULAR ANISOTROPY; PREPARATION CONDITIONS; RADIO FREQUENCY MAGNETRON SPUTTERING; SINGLE-CRYSTALLINE; SUBSTRATE TEMPERATURE; ULTRA THIN MAGNETIC FILMS; VARIOUS SUBSTRATES;

AMORPHOUS FILMS; COBALT; FILM PREPARATION; KERR MAGNETOOPTICAL EFFECT; MAGNETIC FORCE MICROSCOPY; MAGNETIZATION; MAGNETOCRYSTALLINE ANISOTROPY; MAGNETOMETERS; MAGNETOS; METALLIC FILMS; OPTICAL KERR EFFECT; SINGLE CRYSTALS; SUBSTRATES; ULTRATHIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION;

MAGNETIC DOMAINS;

EID: 79955392421     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2010.2589     Document Type: Conference Paper

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