Structure and magnetic properties of hep and fee nanocrystalline thin Ni films and nanoparticles produced by radio frequency magnetron sputtering

Journal of Nanoscience and Nanotechnology

Volumn 10, Issue 9, 2010, Pages 6024-6028

  Kapaklis, Vassilios ^a   Pappas, Spiridon D ^a   Poulopoulos, Panagiotis ^b   Trachylis, Dimitrios ^a   Schweiss, Peter ^c   Politis, Constantin ^a  

^a School of Engineering   (Greece)

^b UNIVERSITY OF PATRAS   (Greece)

^c KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

Magnetic properties of monolayers and thin films; Nanoscale thin film structure and morphology; Nickel; X ray diffraction

Indexed keywords

BALANCE SYSTEMS; GAS PRESSURES; HIGH QUALITY; MAGNETIC PROPERTIES OF MONOLAYERS AND THIN FILMS; MAGNETIC RESPONSE; MAGNETIC SATURATION; MAGNETO-OPTIC KERR EFFECT; MATRIX; NANOCRYSTALLINES; NANOSCALE THIN FILM STRUCTURE AND MORPHOLOGY; NI FILMS; NONMAGNETICS; RADIO FREQUENCY MAGNETRON SPUTTERING; RESIDUAL STRAINS; ROOM TEMPERATURE; SINGLE PHASE; SMALL-ANGLE X-RAY DIFFRACTION PATTERNS; STRUCTURAL CHARACTERIZATION; TECHNOLOGICAL APPLICATIONS; VARIOUS SUBSTRATES;

ARGON; DIFFRACTION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; KERR MAGNETOOPTICAL EFFECT; MAGNETIC PROPERTIES; MAGNETOMETERS; MONOLAYERS; MORPHOLOGY; NANOPARTICLES; NANOSTRUCTURED MATERIALS; QUARTZ; RADIO; RADIO WAVES; SATURATION MAGNETIZATION; THICKNESS MEASUREMENT; THIN FILMS; X RAY DIFFRACTION; X RAYS;

NANOMAGNETICS;

EID: 79955413001     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2010.2594     Document Type: Conference Paper

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