Scanning probe microscopy: Instrumentation and applications on thin films and magnetic multilayers

Journal of Nanoscience and Nanotechnology

Volumn 9, Issue 12, 2009, Pages 6783-6798

  Karoutsos, Vagelis ^a  

^a UNIVERSITY OF PATRAS   (Greece)

Author keywords

Atomic force microscopy; Growth; Magnetic domains; Magnetic forcemicroscopy; Magnetic properties; Multilayers; Nickel; Platinum; Scanning probe microscopy; Thin solid films

Indexed keywords

AFM; COMPOSITIONALLY MODULATED MULTILAYERS; GRAIN DIAMETER; GRAIN SIZE; GRAIN SIZE MEASUREMENT; GROWTH; HYSTERESIS CURVE; MAGNETIZED DOMAINS; METALLIC THIN FILMS; MODES OF OPERATION; POLYIMIDE SUBSTRATE; SCANNING PROBE MICROSCOPE; SCANNING TUNNELING MICROSCOPY (STM); THIN AG FILMS; THIN SOLID FILMS; TIP RADIUS;

ATOMIC FORCE MICROSCOPY; FILM PREPARATION; GLASS; GRAIN SIZE AND SHAPE; INSTRUMENTS; MAGNETIC FORCE MICROSCOPY; MAGNETIC MULTILAYERS; MAGNETIC PROPERTIES; MAGNETIZATION; MEASUREMENTS; METALLIC GLASS; NICKEL ALLOYS; PLATINUM; POLYIMIDES; PROBES; SCANNING; SCANNING TUNNELING MICROSCOPY; SILVER; THIN FILMS; X RAY DIFFRACTION;

MAGNETIC DOMAINS;

NANOMATERIAL;

ARTIFICIAL MEMBRANE; CHEMISTRY; INSTRUMENTATION; MAGNETISM; METHODOLOGY; NANOTECHNOLOGY; REVIEW; SCANNING PROBE MICROSCOPY; ULTRASTRUCTURE;

MAGNETICS; MEMBRANES, ARTIFICIAL; MICROSCOPY, SCANNING PROBE; NANOSTRUCTURES; NANOTECHNOLOGY;

EID: 70350235047     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2009.1474     Document Type: Review

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