On faulting in nanocrystallites of FCC metals

Materials Science Forum

Volumn 681, Issue , 2011, Pages 13-18

  Beyerlein, Kenneth R ^a,b   Leoni, Matteo ^a   Snyder, Robert L ^b   Scardi, Paolo ^a  

^a UNIVERSITY OF TRENTO   (Italy)

^b Georgia Institute of Technology   (United States)

Author keywords

Debye function; Faulting; Line Profile Analysis; X ray powder diffraction

Indexed keywords

FAULTING; PARTICLE SIZE; X RAY POWDER DIFFRACTION;

DEBYE FUNCTION; FAULT DENSITY; FAULT POSITION; FCC METALS; LINE PROFILE ANALYSIS; MODERN LINES; RELATIVE DEVIATIONS; SPHERICAL NANOPARTICLES;

PARTICLE SIZE ANALYSIS;

EID: 79954604323     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.681.13     Document Type: Conference Paper

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