Application of the Debye function to systems of crystallites

Philosophical Magazine

Volumn 90, Issue 29, 2010, Pages 3891-3905

  Beyerlein, Kenneth R ^a,b   Snyder, Robert L ^a   Li, Mo ^a   Scardi, Paolo ^b  

^a Georgia Institute of Technology   (United States)

^b UNIVERSITY OF TRENTO   (Italy)

Author keywords

atomistic simulation; coherency; Debye function; line profile analysis; nanocrystalline material; nanoparticle; whole powder pattern modeling; Williamson Hall plot; X ray diffraction

Indexed keywords

ATOMISTIC SIMULATIONS; COHERENCY; DEBYE FUNCTION; LINE PROFILE ANALYSIS; NANOCRYSTALLINES; WHOLE POWDER PATTERN MODELING; WILLIAMSON-HALL PLOT;

COMPUTER SIMULATION; DIFFRACTION PATTERNS; HOLOGRAPHIC INTERFEROMETRY; NANOCRYSTALLINE MATERIALS; NANOPARTICLES; POLYDISPERSITY; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION; X RAYS;

NANOCRYSTALLINE POWDERS;

EID: 77955965276     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786435.2010.501769     Document Type: Article

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