Robust embedded software design through early analysis of quality faults

Proceedings of the 4th India Software Engineering Conference 2011, ISEC'11

Volumn , Issue , 2011, Pages 31-40

  Das, Dipankar ^a   Chakrabarti, P P ^b   Sinha, Purnendu ^a  

^a India Science Lab   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

Embedded software; Quality analysis; Robust design

Indexed keywords

DESIGN OPTION; DESIGN SPACE EXPLORATION; EARLY EVALUATION; ELECTRO-MECHANICAL; INDIVIDUAL COMPONENTS; LEVEL MODEL; MODEL BASED APPROACH; NEW DESIGN; QUALITY ANALYSIS; QUALITY FAULT; ROBUST DESIGNS; ROBUST SOFTWARE; SOFTWARE COMPONENT;

EMBEDDED SOFTWARE; FAULT TOLERANCE; FITS AND TOLERANCES; QUALITY ASSURANCE; RATING; SOFTWARE DESIGN; SPACE RESEARCH;

QUALITY CONTROL;

EID: 79953887324     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1953355.1953360     Document Type: Conference Paper

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