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Volumn , Issue , 2003, Pages 170-177

Fault-tolerant platforms for automotive safety-critical applications

Author keywords

Automotive; Fault tolerant; Multi processor; Safety critical; System on a chip; VLSI

Indexed keywords

AUTOMOBILES; COLLISION AVOIDANCE; COMPUTER ARCHITECTURE; MICROCONTROLLERS; MULTIPROCESSING SYSTEMS; SAFETY FACTOR; VLSI CIRCUITS;

EID: 3042573509     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/951732.951734     Document Type: Conference Paper
Times cited : (133)

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    • N. Seifert, Xiaowei Zhu, and L.W. Massengill. Impact of scaling on soft-error rates in commercial microprocessors. IEEE Transactions on Nuclear Science, 49(6):3100-3106, Dec 2002.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.